Benewende-Diane Bonkoungou from CEA-Leti presented ARCHIMEDES poster during the 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF2024 in Parma, Italy.
Organised by Universita di Parma, ESREF 2024, the 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis took place from September 23 to 26, 2024.
This International Symposium continue its 35-year history of focusing on the latest research developments and future directions in failure analysis, quality, and reliability of materials, devices, and circuits for microelectronics and optoelectronics, power, space, and automotive electronics. It historically provides a European forum to develop all aspects of reliability, including management and advanced failure analysis techniques for present and emerging semiconductor applications.
More information here: https://www.esref2024.org/
